Compressive STEM-EELS
نویسندگان
چکیده
The collection of electron energy loss spectra (EELS) via scanning transmission electron microscopy (STEM) generally requires a specimen to withstand a large radiation dose. Moreover, significant drift can occur while the spectra are collected. Recent advances in electron microscopy have shown that a data reduction of up to 90% is possible for HAADF/ABF imaging and TEM video [1, 2, 3]. These advances depend on the mathematical theory of compressive sensing (CS) [4]. For STEM [1], the method in [5] (BPFA) was used for a special case of CS called inpainting; the pixels of the image were missing at random. The goal of the inpainting task is to fill-in missing pixels.
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